ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper discusses practical issues involved in applying logic built-in self-test (BIST) to four large industrial designs. These multi-clock designs, ranging in size from 200K t...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Power consumption of digital systems may increase significantly during testing. In this paper, systems equipped with a scan-based built-in self-test like the STUMPS architecture a...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. The power supply transient signals of an ...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...