VTS
1996
IEEE
13 years 8 months ago
1996
IEEE
Some weak static CMOS chips can be detected by testing them with a very low supply voltage -- between 2 and 2.5 times the threshold voltage Vt of the transistors. A weak chip is o...
ITC
1996
IEEE
13 years 8 months ago
1996
IEEE
The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A d...
ISSS
1999
IEEE
13 years 8 months ago
1999
IEEE
This paper presents a real-time task scheduling technique with a variable voltage processor which can vary its supply voltage dynamically. Using such a processor, running tasks wi...
ISQED
2009
IEEE
13 years 11 months ago
2009
IEEE
In this paper challenges observed in 65nm technology for circuits utilizing subthreshold region operation are presented. Different circuits are analyzed and simulated for ultra lo...
VLSID
2002
IEEE
14 years 4 months ago
2002
IEEE
Compare CMOS Logic with Pass-Transistor Logic, a question was raised in our mind: "Does any rule exist that contains all good?" This paper reveals novel logic synthesis ...