ASPDAC
2011
ACM
12 years 8 months ago
2011
ACM
- In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundarie...
ET
2002
13 years 4 months ago
2002
Specification reduction can reduce test time, consequently, test cost. In this paper, a methodology to reduce specifications during specification testing for analog circuit is prop...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
Dealing with static and dynamic parameter variations has become a major challenge for design and test. To avoid unnecessary yield loss and to ensure reliable system operation a ro...
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
— A new oscillator sensitivity analysis that predicts the impact of parameter variations of a VCO in a PLL is presented in this paper. Sensitivities of an oscillator’s steady-s...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
In this paper we describe a flexible and efficient new algorithm for model order reduction of parameterized systems. The method is based on the reformulation of the parametric s...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
With continued advances in CMOS technology, parameter variations are emerging as a major design challenge. Irregularities during the fabrication of a microprocessor and variations...
DAC
2003
ACM
14 years 5 months ago
2003
ACM
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...