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ICCAD
2009
IEEE
96views Hardware» more  ICCAD 2009»
9 years 9 months ago
PSTA-based branch and bound approach to the silicon speedpath isolation problem
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
Sari Onaissi, Khaled R. Heloue, Farid N. Najm
DATE
2003
IEEE
135views Hardware» more  DATE 2003»
10 years 4 months ago
Creating Value Through Test
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
Erik Jan Marinissen, Bart Vermeulen, Robert Madge,...
MTV
2005
IEEE
101views Hardware» more  MTV 2005»
10 years 5 months ago
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
Paolo Bernardi, Michelangelo Grosso, Maurizio Reba...
DAC
2006
ACM
10 years 5 months ago
Visibility enhancement for silicon debug
Several emerging Design-for-Debug (DFD) methodologies are addressing silicon debug by making internal signal values and other data observable. Most of these methodologies require ...
Yu-Chin Hsu, Fur-Shing Tsai, Wells Jong, Ying-Tsai...
DATE
2009
IEEE
115views Hardware» more  DATE 2009»
10 years 6 months ago
Automated data analysis solutions to silicon debug
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...
Yu-Shen Yang, Nicola Nicolici, Andreas G. Veneris
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