ICCAD
2009
IEEE
13 years 2 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
DATE
2003
IEEE
13 years 10 months ago
2003
IEEE
Test is often seen as a necessary evil; it is a fact of life that ICs have manufacturing defects and those need to be filtered out by testing before the ICs are shipped to the cu...
MTV
2005
IEEE
13 years 10 months ago
2005
IEEE
Semiconductor manufacturers aim at deliver new devices within shorter times in order to gain market shares. First silicon debug is an important issue in order to minimize the time...
DAC
2006
ACM
13 years 11 months ago
2006
ACM
Several emerging Design-for-Debug (DFD) methodologies are addressing silicon debug by making internal signal values and other data observable. Most of these methodologies require ...
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Since pre-silicon functional verification is insufficient to detect all design errors, re-spins are often needed due to malfunctions that escape into the silicon. This paper pre...