TVLSI
2008
13 years 4 months ago
2008
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
DAC
2004
ACM
13 years 8 months ago
2004
ACM
There is an increased dominance of intra-die process variations, creating a need for an accurate and fast statistical timing analysis. Most of the recent proposed approaches assum...
VTS
2003
IEEE
13 years 9 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper describes a new post-silicon validation problem for diagnosing systematic timing errors. We illustrate the differences between timing validation and the traditional log...
ASPDAC
2006
ACM
13 years 10 months ago
2006
ACM
Statistical timing analysis has been widely applied to predict the timing yield of VLSI circuits when process variations become significant. Existing statistical latch timing met...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
SSTA has received a considerable amount of attention in recent years. However, it is a general rule that any approach can only be as accurate as the underlying models. Thus, varia...