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ET
2002
115views more  ET 2002»
13 years 4 months ago
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
DFT
2004
IEEE
101views VLSI» more  DFT 2004»
13 years 8 months ago
Designs for Reducing Test Time of Distributed Small Embedded SRAMs
This paper proposes a test architecture aimed at reducing test time of distributed small embedded SRAMs (eSRAMs). This architecture improves the one proposed in [4, 5]. The improv...
Baosheng Wang, Yuejian Wu, André Ivanov
VTS
2005
IEEE
106views Hardware» more  VTS 2005»
13 years 10 months ago
Segmented Addressable Scan Architecture
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuc...
ETS
2006
IEEE
108views Hardware» more  ETS 2006»
13 years 11 months ago
A DFT Architecture for Asynchronous Networks-on-Chip
The Networks-on-Chip (NoCs) paradigm is emerging as a solution for the communication of SoCs. Many NoC architecture propositions are presented but few works on testing these netwo...
Xuan-Tu Tran, Jean Durupt, François Bertran...