DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
SCESM
2006
ACM
13 years 10 months ago
2006
ACM
The dynamic behavior of systems is best described by Finite-state machines. Generation of executable tests from behavioral models such as UML Statecharts offers benefits such as s...
MTV
2006
IEEE
13 years 10 months ago
2006
IEEE
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
GLVLSI
2006
IEEE
13 years 10 months ago
2006
IEEE
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Functional validation is a major bottleneck in pipelined processor design. Simulation using functional test vectors is the most widely used form of processor validation. While exi...
OOPSLA
2007
Springer
13 years 10 months ago
2007
Springer
RANDOOP FOR JAVA generates unit tests for Java code using feedback-directed random test generation. Below we describe RANDOOP’s input, output, and test generation algorithm. We ...
MODELS
2007
Springer
13 years 10 months ago
2007
Springer
Abstract. In this paper, we deal with model-based automatic test generation. We show how to use UML state machines, UML class diagrams, and OCL expressions to automatically derive ...
KBSE
2007
IEEE
13 years 10 months ago
2007
IEEE
We present CESE, a tool that combines exhaustive enumeration of test inputs from a structured domain with symbolic execution driven test generation. We target programs whose valid...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
KBSE
2008
IEEE
13 years 11 months ago
2008
IEEE
—Automatic white-box test generation is a challenging problem. Many existing tools rely on complex code analyses and heuristics. As a result, structural features of an input prog...