VLSID
1997
IEEE
13 years 9 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
Resistive bridging faults in combinational CMOS circuits are studied in this work. Circuit-level models are ed to voltage behavior for use in voltage-level fault simulation and te...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
DAC
1999
ACM
13 years 9 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
ISSTA
2000
ACM
13 years 9 months ago
2000
ACM
Increasing numbers of software developers are using the Unified Modeling Language (UML) and associated visual modeling tools as a basis for the design and implementation of their ...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
computation and automatic abstraction. Second, Ketchum performs not only automatic test generation but also unreachability analysis, which enables the test generation effort to be ...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-underte...
ICSE
2010
IEEE-ACM
13 years 9 months ago
2010
IEEE-ACM
We present an approach for describing tests using nondeterministic test generation programs. To write such programs, we introduce UDITA, a Java-based language with non-determinist...