ITC
1997
IEEE
13 years 8 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
VTS
2003
IEEE
13 years 9 months ago
2003
IEEE
This paper addresses the problem of compacting test responses in the presence of unknowns at the input of the compactor by exploiting the capabilities of well-known error detectio...
ICCD
2004
IEEE
14 years 1 months ago
2004
IEEE
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test ...