Sciweavers

Share
ATS
1997
IEEE
89views Hardware» more  ATS 1997»
10 years 1 months ago
Guaranteeing Testability in Re-encoding for Low Power
This paper considers the testability implications of low power design methodologies. Low power and high testability are shown to be highly contrasting requirements, and an optimiz...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto, Mau...
ICCAD
1998
IEEE
71views Hardware» more  ICCAD 1998»
10 years 2 months ago
High-level variable selection for partial-scan implementation
In this paper, we propose a high-level variable selection for partial-scan approach to improve the testability of digital systems. The testability of a design is evaluated at the ...
Frank F. Hsu, Janak H. Patel
ISSTA
2000
ACM
10 years 2 months ago
Testability, fault size and the domain-to-range ratio: An eternal triangle
A number of different concepts have been proposed that, loosely speaking, revolve around the notion of software testability. Indeed, the concept of testability itself has been int...
Martin R. Woodward, Zuhoor A. Al-Khanjari
METRICS
2002
IEEE
10 years 2 months ago
Testability Analysis of a UML Class Diagram
Design-for-testability is a very important issue in software engineering. It becomes crucial in the case of OO designs where control flows are generally not hierarchical, but are d...
Benoit Baudry, Yves Le Traon, Gerson Sunyé
METRICS
2003
IEEE
10 years 3 months ago
Measuring and Improving Design Patterns Testability
This paper addresses not only the question of testability measurement of OO designs but also focuses on its practicability. While detecting testability weaknesses (called testabil...
Benoit Baudry, Yves Le Traon, Gerson Sunyé,...
ISCAS
2003
IEEE
96views Hardware» more  ISCAS 2003»
10 years 3 months ago
A novel improvement technique for high-level test synthesis
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
Saeed Safari, Hadi Esmaeilzadeh, Amir-Hossein Jaha...
ATS
2005
IEEE
139views Hardware» more  ATS 2005»
10 years 3 months ago
Shannon Expansion Based Supply-Gated Logic for Improved Power and Testability
— Structural transformation of a design to enhance its testability while satisfying design constraints on power and performance, can result in improved test cost and test confid...
Swaroop Ghosh, Swarup Bhunia, Kaushik Roy
DSD
2007
IEEE
87views Hardware» more  DSD 2007»
10 years 4 months ago
On the Construction of Small Fully Testable Circuits with Low Depth
During synthesis of circuits for Boolean functions area, delay and testability are optimization goals that often contradict each other. Multi-level circuits are often quite small ...
Görschwin Fey, Anna Bernasconi, Valentina Cir...
DSD
2008
IEEE
85views Hardware» more  DSD 2008»
10 years 4 months ago
TASTE: Testability Analysis Engine and Opened Libraries for Digital Data Path
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
Josef Strnadel
books