Sciweavers

Share
warning: Creating default object from empty value in /var/www/modules/taxonomy/taxonomy.module on line 1416.
ASPDAC
2004
ACM
102views Hardware» more  ASPDAC 2004»
11 years 4 months ago
TranGen: a SAT-based ATPG for path-oriented transition faults
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Kai Yang, Kwang-Ting Cheng, Li-C. Wang
VTS
2005
IEEE
96views Hardware» more  VTS 2005»
11 years 4 months ago
Effective TARO Pattern Generation
TARO test patterns are transition fault test patterns that sensitize each transition fault to all of the outputs that can be reached from the fault location. We were not able to i...
Intaik Park, Ahmad A. Al-Yamani, Edward J. McClusk...
ASPDAC
2009
ACM
262views Hardware» more  ASPDAC 2009»
11 years 5 months ago
Fault modeling and testing of retention flip-flops in low power designs
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
Bing-Chuan Bai, Augusli Kifli, Chien-Mo James Li, ...
DATE
2009
IEEE
77views Hardware» more  DATE 2009»
11 years 5 months ago
On the relationship between stuck-at fault coverage and transition fault coverage
The single stuck-at fault coverage is often seen as a figure-of-merit also for scan testing according to other fault models like transition faults, bridging faults, crosstalk faul...
Jan Schat
books