VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the ai...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Multi-level TAM optimization is necessary for modular testing of hierarchical SOCs that contain older-generation SOCs as embedded cores. We present two hierarchical TAM optimizati...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
— In this paper, we study the problem of delay defect diagnosis based on statistical timing models. We propose a diagnosis algorithm that can effectively utilize statistical timi...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper improves upon the state of the art in testing word oriented memories. It first presents a complete set of fault models for intra-word coupling faults. Then, it establi...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...