VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
A new method for test resource partitioning is introduced which keeps the design-for-test logic independent of the test set and moves the test pattern dependent information to an ...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
Nanometer circuits are highly susceptible to soft errors generated by alpha-particle or atmospheric neutron strikes to circuit nodes. The reasons for the high susceptibility are t...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
An automated design procedure is described for synthesizing circuits with low power concurrent error detection. It is based on pre-synthesis selection of a parity-check code follo...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
FPGA-based designs are more susceptible to single-event upsets (SEUs) compared to ASIC designs, since SEUs in configuration bits of FPGAs result in permanent errors in the mapped...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations introduced by defects at a set of power supply pads on the ...