DFT   2008 IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Wall of Fame | Most Viewed DFT-2008 Paper
182views VLSI» more  DFT 2008»
13 years 8 months ago
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoo...
Disclaimer and Copyright Notice
Sciweavers respects the rights of all copyright holders and in this regard, authors are only allowed to share a link to their preprint paper on their own website. Every contribution is associated with a desciptive image. It is the sole responsibility of the authors to ensure that their posted image is not copyright infringing. This service is compliant with IEEE copyright.
1Download preprint from source182
2Download preprint from source151
3Download preprint from source149
4Download preprint from source138
5Download preprint from source120
6Download preprint from source117
7Download preprint from source107
8Download preprint from source106
9Download preprint from source103
10Download preprint from source89
11Download preprint from source86
12Download preprint from source86
13Download preprint from source82