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IOLTS   2006 IEEE International On-Line Testing Symposium
Wall of Fame | Most Viewed IOLTS-2006 Paper
IOLTS
2006
IEEE
103views Hardware» more  IOLTS 2006»
13 years 11 months ago
Designing Robust Checkers in the Presence of Massive Timing Errors
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
Frederic Worm, Patrick Thiran, Paolo Ienne
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