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VTS   2006 IEEE VLSI Test Symposium
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VTS
2006
IEEE
133views Hardware» more  VTS 2006»
14 years 3 months ago
PEAKASO: Peak-Temperature Aware Scan-Vector Optimization
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...
Minsik Cho, David Z. Pan
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