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ITC
1995
IEEE
122views Hardware» more  ITC 1995»
15 years 8 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner
ITC
1995
IEEE
104views Hardware» more  ITC 1995»
15 years 8 months ago
Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
Nur A. Touba, Edward J. McCluskey
SPAA
1997
ACM
15 years 8 months ago
Efficient Detection of Determinacy Races in Cilk Programs
A parallel multithreaded program that is ostensibly deterministic may nevertheless behave nondeterministically due to bugs in the code. These bugs are called determinacy races, an...
Mingdong Feng, Charles E. Leiserson
140
Voted
SP
1997
IEEE
139views Security Privacy» more  SP 1997»
15 years 8 months ago
Number Theoretic Attacks on Secure Password Schemes
Encrypted Key Exchange (EKE) [1, 2] allows two parties sharing a password to exchange authenticated information over an insecure network by using a combination of public and secre...
Sarvar Patel
ITC
1995
IEEE
124views Hardware» more  ITC 1995»
15 years 8 months ago
An Experimental Chip to Evaluate Test Techniques: Experiment Results
This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
Siyad C. Ma, Piero Franco, Edward J. McCluskey