149
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ITC
1995
IEEE
15 years 8 months ago
1995
IEEE
Real-world data is known to be imperfect, suffering from various forms of defects such as sensor variability, estimation errors, uncertainty, human errors in data entry, and gaps ...
138
Voted
ITC
1995
IEEE
15 years 8 months ago
1995
IEEE
An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
125
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SOFSEM
1997
Springer
15 years 8 months ago
1997
Springer
Abstract. We examine the problem of finite-state representability of infinitestate processes w.r.t. certain behavioural equivalences. We show that the classical notion of regularit...