ITC
2000
IEEE
15 years 7 months ago
2000
IEEE
123
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ITC
2000
IEEE
15 years 7 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...
TOOLS
1998
IEEE
15 years 7 months ago
1998
IEEE
118
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ISW
2000
Springer
15 years 7 months ago
2000
Springer
An one-way hash chain generated by the iterative use of a one-way hash function on a secret value has recently been widely employed to develop many practical cryptographic solution...
138
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ISW
2000
Springer
15 years 7 months ago
2000
Springer
We propose a simple classification method for public-key based authentication protocols, which consists of identifying several basic properties leading to a large number of generic...