Due to the extremely large sizes of power grids, IR drop analysis has become a computationally challenging problem both in terms of runtime and memory usage. It has been shown in [...
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
- Two challenges for the accurate prediction of GHz CMOS analog/RF building blocks are presented. Challenging the usage of new compact MOSFET models enhances the simulation accurac...