151
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
135
Voted
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
142
Voted
ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
In this paper, we present a systematic synthesis methodology for fully integrated wideband low noise amplifiers that simultaneously optimizes impedance matching, noise figure, and ...