163
Voted
DAC
2004
ACM
16 years 8 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
170
Voted
DAC
2004
ACM
16 years 8 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
182
click to vote
DAC
2004
ACM
16 years 8 months ago
2004
ACM
We investigate trade-offs in microprocessor frequency and system power achievable for low temperature operation in scaled high leakage technologies by combining refrigeration with...