145
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DAC
2005
ACM
16 years 8 months ago
2005
ACM
We present a new methodology which takes into consideration the effect of Within-Die (WID) process variations on a low-voltage parallel system. We show that in the presence of pro...
188
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DAC
2004
ACM
16 years 8 months ago
2004
ACM
Circuits using nano-meter technologies are becoming increasingly vulnerable to signal interference from multiple noise sources as well as radiation-induced soft errors. One way to...
185
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DAC
2004
ACM
16 years 8 months ago
2004
ACM
With deep-sub-micron (DSM) technology, statistical timing analysis becomes increasingly crucial to characterize signal transmission over global interconnect wires. In this paper, ...
117
Voted
DAC
2004
ACM
16 years 8 months ago
2004
ACM
