Sciweavers

DAC
2009
ACM
16 years 8 months ago
Statistical reliability analysis under process variation and aging effects
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
Yinghai Lu, Li Shang, Hai Zhou, Hengliang Zhu, Fan...
DAC
2009
ACM
16 years 8 months ago
Provably good and practically efficient algorithms for CMP dummy fill
Abstract--To reduce chip-scale topography variation in Chemical Mechanical Polishing (CMP) process, dummy fill is widely used to improve the layout density uniformity. Previous res...
Chunyang Feng, Hai Zhou, Changhao Yan, Jun Tao, Xu...
DAC
2009
ACM
16 years 8 months ago
Event-driven gate-level simulation with GP-GPUs
Logic simulation is a critical component of the design tool flow in modern hardware development efforts. It is used widely ? from high-level descriptions down to gate-level ones ?...
Debapriya Chatterjee, Andrew DeOrio, Valeria Berta...
DAC
2009
ACM
16 years 8 months ago
Efficient SAT solving for non-clausal formulas using DPLL, graphs, and watched cuts
Boolean satisfiability (SAT) solvers are used heavily in hardware and software verification tools for checking satisfiability of Boolean formulas. Most state-of-the-art SAT solver...
Himanshu Jain, Edmund M. Clarke