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ETS
2006
IEEE

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Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices

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Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices

Download www.icsd2.tj.chiba-u.jp

Kentaroh Katoh, Hideo Ito

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ETS 2006 | Hardware |

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Added	11 Jun 2010
Updated	11 Jun 2010
Type	Conference
Year	2006
Where	ETS
Authors	Kentaroh Katoh, Hideo Ito

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