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    ITC
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    IEEE
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    On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs

    15 years 2 months ago
    On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs
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    Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
    claim paper
    Added 04 Jul 2010
    Updated 04 Jul 2010
    Type Conference
    Year 2003
    Where ITC
    Authors Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz
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