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Neural Networks-Based Parametric Testing of Analog IC

15 years 7 months ago
Neural Networks-Based Parametric Testing of Analog IC
Viera Stopjaková, D. Micusík, Lubica
Added 14 Jul 2010
Updated 14 Jul 2010
Type Conference
Year 2002
Where DFT
Authors Viera Stopjaková, D. Micusík, Lubica Benusková, Martin Margala
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