Low-voltage analog current detector supporting at-speed BIST

This paper presents a design of a low-voltage analog current detector supporting at-speed Built-In-Self-Test (BIST) methodology. In testing mode, the current detector performs a non-functional Iddq and delta Iddq test which

• Type: Conference
• Year: 2002
• Where: ISCAS
• Authors: Srdjan Dragic, Igor M. Filanovsky, Martin Margala
• Keywords: Analog Current Detector, Current Detector, Delta Iddq Test, Hardware, ISCAS 2002