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ITC
2002
IEEE

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A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits

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A DFT Technique for Low Frequency Delay Fault Testing in High Performance Digital Circuits

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Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

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Added	15 Jul 2010
Updated	15 Jul 2010
Type	Conference
Year	2002
Where	ITC
Authors	Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi

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