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GLVLSI
1998
IEEE
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Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling

16 years 1 days ago
Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling
Irith Pomeranz, Sudhakar M. Reddy
Added 04 Aug 2010
Updated 04 Aug 2010
Type Conference
Year 1998
Where GLVLSI
Authors Irith Pomeranz, Sudhakar M. Reddy
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