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Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments

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Exploiting High-Level Descriptions for Circuits Fault Tolerance Assessments
Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo
Added 06 Aug 2010
Updated 06 Aug 2010
Type Conference
Year 1997
Where DFT
Authors Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda, Jaan Raik, Raimund Ubar
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