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ICCAD
1990
IEEE

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An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis

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An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis

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Yusuf Leblebici, Sung-Mo Kang

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Added	11 Aug 2010
Updated	11 Aug 2010
Type	Conference
Year	1990
Where	ICCAD
Authors	Yusuf Leblebici, Sung-Mo Kang

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