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87

DFT
2007
IEEE

86views VLSI» more DFT 2007»

Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines

15 years 6 months ago

Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines

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Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa,

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Added	14 Aug 2010
Updated	14 Aug 2010
Type	Conference
Year	2007
Where	DFT
Authors	Hiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume

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