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    IEICET
    2008
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    Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-

    15 years 4 days ago
    Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-
    Download  www.ics.ee.nctu.edu.tw
    Jung-Sheng Chen, Ming-Dou Ker
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    Added 11 Dec 2010
    Updated 11 Dec 2010
    Type Journal
    Year 2008
    Where IEICET
    Authors Jung-Sheng Chen, Ming-Dou Ker
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