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ETS
2006
IEEE

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Minimal March Tests for Dynamic Faults in Random Access Memories

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Minimal March Tests for Dynamic Faults in Random Access Memories

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Gurgen Harutunyan, Valery A. Vardanian, Yervant Zo

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Added	12 Dec 2010
Updated	12 Dec 2010
Type	Journal
Year	2006
Where	ETS
Authors	Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian

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