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96
Voted
MR
2006
2006
New experimental findings on hot-carrier-induced degradation in lateral DMOS transistors
Real-time Traffic| Added | 14 Dec 2010 |
| Updated | 14 Dec 2010 |
| Type | Journal |
| Year | 2006 |
| Where | MR |
| Authors | In Kyung Lee, Se Re Na Yun, Kyosun Kim, Chong-Gun Yu, Jong-Tae Park |
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