Sciweavers

Free Online Productivity Tools i2Speak i2Symbol i2OCR iTex2Img iWeb2Print iWeb2Shot i2Type iPdf2Split iPdf2Merge i2Bopomofo i2Arabic i2Style i2Image i2PDF iLatex2Rtf Sci2ools

23

Voted

STVR
2008

favoriteEmaildiscussreport

53views more STVR 2008»

IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

14 years 9 months ago

IPOG/IPOG-D: efficient test generation for multi-way combinatorial testing

Download csrc.nist.gov

Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun,

Real-time Traffic

STVR 2008 |

claim paper

Related Content

» IRPS An Efficient Test Data Generation Strategy for Pairwise Testing

» Automated Test Data Generation on the Analyses of Feature Models A Metamorphic Testing App...

» PseudoExhaustive Testing for Software

» ThermalAware SoC Test Scheduling with Test Set Partitioning and Interleaving

» Derandomizing homomorphism testing in general groups

» An Analytical Comparison of Optimization Problem Generation Methodologies

» FastFind A novel computational approach to analyzing combinatorial motifs

» Novel Definition and Algorithm for Chaining Fragments with Proportional Overlaps

» An Evolutionary Local Search Algorithm for the Satisfiability Problem

Post Info
More Details (n/a)

Added	15 Dec 2010
Updated	15 Dec 2010
Type	Journal
Year	2008
Where	STVR
Authors	Yu Lei, Raghu Kacker, D. Richard Kuhn, Vadim Okun, James Lawrence

Comments (0)