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27

CVPR
1996
IEEE

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Eigenfeatures for planar pose measurement of partially occluded objects

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Eigenfeatures for planar pose measurement of partially occluded objects

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John Krumm

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Computer Vision | CVPR 1996 | Planar Pose Measurement |

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Added	12 Oct 2009
Updated	12 Oct 2009
Type	Conference
Year	1996
Where	CVPR
Authors	John Krumm

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