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82
Voted
STOC
2003
ACM
2003
ACM
Randomness-efficient low degree tests and short PCPs via epsilon-biased sets
Real-time Traffic| Added | 03 Dec 2009 |
| Updated | 03 Dec 2009 |
| Type | Conference |
| Year | 2003 |
| Where | STOC |
| Authors | Eli Ben-Sasson, Madhu Sudan, Salil P. Vadhan, Avi Wigderson |
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