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81

ICCD
2005
IEEE

63views Hardware» more ICCD 2005»

A Dual Dielectric Approach for Performance Aware Gate Tunneling Reduction in Combinational Circuits

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A Dual Dielectric Approach for Performance Aware Gate Tunneling Reduction in Combinational Circuits

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Valmiki Mukherjee, Saraju P. Mohanty, Elias Kougia

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Added	16 Mar 2010
Updated	16 Mar 2010
Type	Conference
Year	2005
Where	ICCD
Authors	Valmiki Mukherjee, Saraju P. Mohanty, Elias Kougianos

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