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ICCAD
2004
IEEE

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SPIN-TEST: automatic test pattern generation for speed-independent circuits

15 years 7 months ago

SPIN-TEST: automatic test pattern generation for speed-independent circuits

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Feng Shi, Yiorgos Makris

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Added	16 Mar 2010
Updated	16 Mar 2010
Type	Conference
Year	2004
Where	ICCAD
Authors	Feng Shi, Yiorgos Makris

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