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111
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HICSS
2009
IEEE
108
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Biometrics
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HICSS 2009
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Challenging the Mean Time to Failure: Measuring Dependability as a Mean Failure Cost
15 years 9 months ago
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Ali Mili, Frederick T. Sheldon
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Added
19 May 2010
Updated
19 May 2010
Type
Conference
Year
2009
Where
HICSS
Authors
Ali Mili, Frederick T. Sheldon
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Researcher Info
Biometrics Study Group
Computer Vision