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DATE
2008
IEEE

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Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

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Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies

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Georges G. E. Gielen, P. De Wit, Elie Maricau, J.

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Added	29 May 2010
Updated	29 May 2010
Type	Conference
Year	2008
Where	DATE
Authors	Georges G. E. Gielen, P. De Wit, Elie Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría

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