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ICRA
2008
IEEE

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SLAM for ship hull inspection using exactly sparse extended information filters

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SLAM for ship hull inspection using exactly sparse extended information filters

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Matthew Walter, Franz Hover, John J. Leonard

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Added	30 May 2010
Updated	30 May 2010
Type	Conference
Year	2008
Where	ICRA
Authors	Matthew Walter, Franz Hover, John J. Leonard

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