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125

Voted

VTS
2008
IEEE

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Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes

15 years 9 months ago

Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes

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Yu-Ze Wu, Mango Chia-Tso Chao

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Added	01 Jun 2010
Updated	01 Jun 2010
Type	Conference
Year	2008
Where	VTS
Authors	Yu-Ze Wu, Mango Chia-Tso Chao

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