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2007
IEEE
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A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays

15 years 9 months ago
A Test-Structure to Efficiently Study Threshold-Voltage Variation in Large MOSFET Arrays
Nigel Drego, Anantha Chandrakasan, Duane S. Boning
Added 04 Jun 2010
Updated 04 Jun 2010
Type Conference
Year 2007
Where ISQED
Authors Nigel Drego, Anantha Chandrakasan, Duane S. Boning
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