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    IEEE
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    Analysis of The Test Data Volume Reduction Benefit of Modular SOC Testing

    15 years 9 months ago
    Analysis of The Test Data Volume Reduction Benefit of Modular SOC Testing
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    Ozgur Sinanoglu, Erik Jan Marinissen
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    Added 29 May 2010
    Updated 29 May 2010
    Type Conference
    Year 2008
    Where DATE
    Authors Ozgur Sinanoglu, Erik Jan Marinissen
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