18 search results - page 1 / 4 » Analysis of The Test Data Volume Reduction Benefit of Modula... |
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
Low-Cost test methodologies for Systems-on-Chip are increasingly popular. They dictate which features have to be included on-chip and which test procedures have to be adopted in o...
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
ITC
2002
IEEE
15 years 2 months ago
2002
IEEE
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of various cores may result in exceeding power thres...
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...