Sciweavers

Free Online Productivity Tools i2Speak i2Symbol i2OCR iTex2Img iWeb2Print iWeb2Shot i2Type iPdf2Split iPdf2Merge i2Bopomofo i2Arabic i2Style i2Image i2PDF iLatex2Rtf Sci2ools

9

ETS
2006
IEEE

favoriteEmaildiscussreport

77views Hardware» more ETS 2006»

Enhancing Delay Fault Coverage through Low Power Segmented Scan

14 years 12 days ago

Enhancing Delay Fault Coverage through Low Power Segmented Scan

Download eprints.ecs.soton.ac.uk

Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Jan

Real-time Traffic

ETS 2006 | Hardware |

claim paper

Related Content

» First Level Hold A Novel LowOverhead Delay Fault Testing Technique

» A LowOverhead Design for Testability and Test Generation Technique for CoreBased Systems

» Broadband Source Localization From an Eigenanalysis Perspective

Post Info
More Details (n/a)

Added	11 Jun 2010
Updated	11 Jun 2010
Type	Conference
Year	2006
Where	ETS
Authors	Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Janusz Rajski, Bashir M. Al-Hashimi

Comments (0)