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ETS
2006
IEEE
77views Hardware» more  ETS 2006»
15 years 3 months ago
Enhancing Delay Fault Coverage through Low Power Segmented Scan
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz, Jan...
DFT
2004
IEEE
93views VLSI» more  DFT 2004»
15 years 1 months ago
First Level Hold: A Novel Low-Overhead Delay Fault Testing Technique
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
15 years 1 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
TASLP
2010
167views more  TASLP 2010»
14 years 4 months ago
Broadband Source Localization From an Eigenanalysis Perspective
Abstract--Broadband source localization has several applications ranging from automatic video camera steering to target signal tracking and enhancement through beamforming. Consequ...
Mehrez Souden, Jacob Benesty, Sofiène Affes